Cantilever
The Nascatec-Levers are made out of single crystal silicon to provide the customer
a high chemical stability and a high
Q-factor. The pyramidal tip is well located
at the very end of the cantilever beam.
The tip is extra sharpened to leed up
to a tip radius of well below 10 nm.
The silicon based beam deflection cantilevers
are available for many different measurement
modes.
AFM Canilever
Family
Piezoresistive
Force Cantilever
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SNOM
For the SNOM-Cantilevers we replaced the solid silicon tip by a hollow pyramid
with an aperture size of 50 or 100 nm.
Compared to a fibre SNOM-Sensor the Cantilever
SNOM shows much higher light transmission,
up to a factor of 100 and puts the user
in a position to also measure the topography
with approx. comparable resolution like
standard AFM.
The aperture size can be changed to meet
the demands of the users.
Nascatec is the only manufacturer of
those sensors worldwide.
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Nanomanipulator
The Nascatec nanogripper is a electrostatically driven. It is build to operate
and manipulate smallest particles and components.
It can operate in standard atmosphere as well
as in UHV conditions.
Long-term tests of more than 10 million opening
and closing actions prove the long term stability.
The nanogripper can be delivered with tweezers
opening of 170 microns and 50 microns.
Other tweezer openings down to 5 microns can
be customized.
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